Exploring disorder correlations in superconducting systems: spectroscopic insights and matrix element effects

• Vyacheslav D. Neverov,
• Alexander E. Lukyanov,
• Andrey V. Krasavin,
• Alexei Vagov,
• Boris G. Lvov and
• Mihail D. Croitoru

Beilstein J. Nanotechnol. 2024, 15, 199–206, doi:10.3762/bjnano.15.19

• kind of X-ray microscopy and has come to the conclusion that such fractal structures boost superconductivity. In particular, the work demonstrates that this material has a small number of very highly ordered regions and larger numbers of disordered regions, with a power-law distribution describing them

TEM sample preparation of lithographically patterned permalloy nanostructures on silicon nitride membranes

• Joshua Williams,
• Michael I. Faley,
• Joseph Vimal Vas,
• Peng-Han Lu and
• Rafal E. Dunin-Borkowski

Beilstein J. Nanotechnol. 2024, 15, 1–12, doi:10.3762/bjnano.15.1

• ], transmission electron microscopy (TEM) [1][8][9][10][11], scanning transmission X-ray microscopy [12][13], and magneto-optical Kerr effect microscopy [14][15]. Possible applications of Py nanodisks were proposed for zero-hysteresis magnet sensors, magnetic logic devices, and data storage [16]. Py is a nickel

The role of convolutional neural networks in scanning probe microscopy: a review

• Ido Azuri,
• Irit Rosenhek-Goldian,
• Neta Regev-Rudzki,
• Georg Fantner and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2021, 12, 878–901, doi:10.3762/bjnano.12.66

• widely applicable for different image segmentation tasks encompassing both 2D and 3D image types. The authors demonstrated segmentation of membranes, mitochondria, and nuclei for images of a mouse brain slice using different microscopic techniques such as CT X-ray microscopy, electron tomography

High-throughput synthesis of modified Fresnel zone plate arrays via ion beam lithography

• Kahraman Keskinbora,
• Umut Tunca Sanli,
• Margarita Baluktsian,
• Corinne Grévent,
• Markus Weigand and
• Gisela Schütz

Beilstein J. Nanotechnol. 2018, 9, 2049–2056, doi:10.3762/bjnano.9.194

• are often the best choice for high-resolution, high-energy beam focusing applications such as scanning transmission X-ray microscopy [3], EUV lithography (EUVL) mask inspection [4][5][6][7] and direct-write EUVL [8][9], and soft and even hard X-ray lithography [10]. When fabricated to tight tolerances

• realization demonstrates the capabilities of modern focused ion beam instrumentation for direct-write lithography. Soft X-ray microscopy tests using the FZP The imaging resolution and the DE of the FZP were tested using a scanning transmission X-ray microscope (STXM) [43] as described earlier [28]. The

• microscope images were taken using the STEM mode of the Nanolab600. Scanning transmission X-ray microscopy experiments FZPs were mounted as the focusing optic in a state-of-the-art STXM, MAXYMUS [43], located at UE46-PGM-2 beamline of BESSY II facility in Berlin, as described before [28]. An energy range

Microwave synthesis of high-quality and uniform 4 nm ZnFe₂O₄ nanocrystals for application in energy storage and nanomagnetics

• Christian Suchomski,
• Ben Breitung,
• Ralf Witte,
• Michael Knapp,
• Sondes Bauer,
• Tilo Baumbach,
• Christian Reitz and
• Torsten Brezesinski

Beilstein J. Nanotechnol. 2016, 7, 1350–1360, doi:10.3762/bjnano.7.126

• transmission X-ray microscopy using a Carl Zeiss TXM and the corresponding data treatment steps are described elsewhere [25]. To determine the oxidation state of Fe, several different Fe-based compounds were measured and used as the references. The fitting of X-ray absorption near edge structure spectra is

• further insight into both the electrochemical reactions of ZFO with Li and the oxidation state of Fe, combined full-field transmission X-ray microscopy (TXM) and X-ray absorption near edge structure (XANES) spectroscopy was conducted on “pristine” and pre-cycled nanoparticle electrodes at the NANO

Magnetic switching of nanoscale antidot lattices

• Ulf Wiedwald,
• Joachim Gräfe,
• Kristof M. Lebecki,
• Maxim Skripnik,
• Felix Haering,
• Gisela Schütz,
• Paul Ziemann,
• Eberhard Goering and
• Ulrich Nowak

Beilstein J. Nanotechnol. 2016, 7, 733–750, doi:10.3762/bjnano.7.65

• ; magnetic nanostructures; magnetic switching; micromagnetic simulations; plasma etching; spin ice; X-ray microscopy; Introduction In nanotechnology, a widely used approach for tailoring physical properties on the nanometre length scale is the introduction of practically circular holes – so-called antidots

• (MFM), and scanning transmission X-ray microscopy (STXM) deliver magnetic maps even down to a single antidot unit cell. One example of the prepared antidot lattices is displayed in Figure 2. The scanning electron microscopy (SEM) image shows a Fe antidot array with a = 200 nm, d = 125 nm and thickness

Atomic scale interface design and characterisation

• Carla Bittencourt,
• Chris Ewels and
• Arkady V. Krasheninnikov

Beilstein J. Nanotechnol. 2015, 6, 1708–1711, doi:10.3762/bjnano.6.174

• -ray microscopy has shown to be a powerful tool for chemical analysis of radiation-sensitive nanomaterial [7]. Combining the chemical and magnetic information provided by XPEEM with the structural sensitivity of LEEM has created a complete characterization tool of material properties at the nanometer

• expanding range of applications for related nanomaterials such as boron nitride nanotubes [22] and silicon and germanium nanocrystals [23]. Recent developments in X-rays collimation optics triggered the interest in synchrotron radiation-based techniques for the study of nanostructures. In this context, X

Overview of nanoscale NEXAFS performed with soft X-ray microscopes

• Peter Guttmann and
• Carla Bittencourt

Beilstein J. Nanotechnol. 2015, 6, 595–604, doi:10.3762/bjnano.6.61

• spectroscopy studies which will be shown in this review. Here we will give an overview of the different microscopes used for NEXAFS studies and describe their advantages and disadvantages for different samples. Keywords: NEXAFS; STXM; TXM; X-ray microscopy; Review Introduction Several analysis tools and

• high productive at synchrotron sources. Macromolecular crystals of proteins, viruses or nuclic acids are studied at the atomic structural level [1]. The development of drugs by understanding the interaction is greatly influenced by this technique. X-ray microscopy techniques enable the study of thick

• nanostructures needs spatial resolution in the nanoscale range together with X-ray spectroscopy methods. X-ray microscopy reaches a higher Rayleigh resolution than optical microscopy as the resolution is decreasing linear with the wavelength. Additionally, the larger penetration depth and smaller radiation

Overview about the localization of nanoparticles in tissue and cellular context by different imaging techniques

• Anja Ostrowski,
• Daniel Nordmeyer,
• Alexander Boreham,
• Cornelia Holzhausen,
• Lars Mundhenk,
• Christina Graf,
• Martina C. Meinke,
• Annika Vogt,
• Sabrina Hadam,
• Jürgen Lademann,
• Eckart Rühl,
• Ulrike Alexiev and
• Achim D. Gruber

Beilstein J. Nanotechnol. 2015, 6, 263–280, doi:10.3762/bjnano.6.25

• structured illumination, Raman microspectroscopy and X-ray microscopy. Importantly, all methodologies described allow for the simultaneous visualization of nanoparticles and evaluation of cell and tissue changes that are of prime interest for toxicopathologic studies. However, the different approaches vary

• structured illumination, Raman microspectroscopy and X-ray microscopy. Review Light microscopy Light microscopic examination has become the gold standard of pathologic evaluation and risk assessment of drugs and nanoparticles during the past 50 years. This technology uses sections of 3 to 8 µm thickness from

• ]. Furthermore, the accessibility of biological samples for CARS is also limited due to high laser powers that might destroy the sample as well as a high concentration of certain molecules that are required [141]. Soft X-ray microscopy and spectromicroscopy Soft X-ray microscopy techniques combine high spatial

Interaction of dermatologically relevant nanoparticles with skin cells and skin

• Annika Vogt,
• Fiorenza Rancan,
• Sebastian Ahlberg,
• Berouz Nazemi,
• Chun Sik Choe,
• Maxim E. Darvin,
• Sabrina Hadam,
• Ulrike Blume-Peytavi,
• Kateryna Loza,
• Jörg Diendorf,
• Matthias Epple,
• Christina Graf,
• Eckart Rühl,
• Martina C. Meinke and
• Jürgen Lademann

Beilstein J. Nanotechnol. 2014, 5, 2363–2373, doi:10.3762/bjnano.5.245

• cellular uptake, including optical microscopy, electron microscopy, X-ray microscopy on cells and tissue sections, flow cytometry of isolated skin cells as well as Raman microscopy on whole tissue blocks. In order to assess the biological relevance of such findings, cell viability and free radical

• scanning transmission X-ray microscopy (STXM) studies on human skin, which allowed us to visualize silica-shell/gold-core particles in the size range of 94–298 nm on superficial layers of the stratum corneum and in hair follicle openings at the single particle level (Figure 1c, see [4] for further details

• generate valid data, however, it is not sufficient to rely on the penetration depth alone [9]. A deeper understanding can only be obtained by combining different approaches. Notably, X-ray microscopy could become a valuable tool for imaging with high spatial resolution combined with analysis of

PVP-coated, negatively charged silver nanoparticles: A multi-center study of their physicochemical characteristics, cell culture and in vivo experiments

• Sebastian Ahlberg,
• Alexandra Antonopulos,
• Jörg Diendorf,
• Ralf Dringen,
• Matthias Epple,
• Rebekka Flöck,
• Wolfgang Goedecke,
• Christina Graf,
• Nadine Haberl,
• Jens Helmlinger,
• Fabian Herzog,
• Frederike Heuer,
• Stephanie Hirn,
• Christian Johannes,
• Stefanie Kittler,
• Manfred Köller,
• Katrin Korn,
• Wolfgang G. Kreyling,
• Fritz Krombach,
• Jürgen Lademann,
• Kateryna Loza,
• Eva M. Luther,
• Marcelina Malissek,
• Martina C. Meinke,
• Daniel Nordmeyer,
• Anne Pailliart,
• Jörg Raabe,
• Fiorenza Rancan,
• Barbara Rothen-Rutishauser,
• Eckart Rühl,
• Carsten Schleh,
• Andreas Seibel,
• Christina Sengstock,
• Lennart Treuel,
• Annika Vogt,
• Katrin Weber and
• Reinhard Zellner

Beilstein J. Nanotechnol. 2014, 5, 1944–1965, doi:10.3762/bjnano.5.205

• demonstrated for hMSC, primary T-cells, primary monocytes, and astrocytes. A visualization of particles inside cells is possible by X-ray microscopy, fluorescence microscopy, and combined FIB/SEM analysis. By staining organelles, their localization inside the cell can be additionally determined. While primary

• sensitivity to provide an accurate local elemental analysis. The requirements mentioned are fulfilled, however, by scanning transmission X-ray microscopy (STXM) [72][73][74]. In this technique, high-brilliance, tunable synchrotron radiation in the soft X-ray regime is tightly focused, and the specimen is

• raster-scanned while the intensity of transmitted X-rays is recorded so that two-dimensional images are obtained. Besides a high spatial resolution (15 nm), X-ray microscopy provides a chemical contrast because of the strong variation of the absorption cross section in core level absorption. This also

Electron-beam induced deposition and autocatalytic decomposition of Co(CO)₃NO

• Florian Vollnhals,
• Martin Drost,
• Fan Tu,
• Esther Carrasco,
• Andreas Späth,
• Rainer H. Fink,
• Hans-Peter Steinrück and
• Hubertus Marbach

Beilstein J. Nanotechnol. 2014, 5, 1175–1185, doi:10.3762/bjnano.5.129

• nitrosyl, Co(CO)3NO. Different deposits are prepared on silicon nitride membranes and silicon wafers under ultrahigh vacuum conditions, and are studied by scanning electron microscopy (SEM) and scanning transmission X-ray microscopy (STXM), including near edge X-ray absorption fine structure (NEXAFS

• deposition; nanofabrication; scanning transmission X-ray microscopy; Introduction The fabrication of nanostructures by using focused electron-beam induced processing (FEBIP) techniques, especially electron-beam induced deposition (EBID), has progressed considerably over the last decade [1][2][3][4][5]. In

• resulting deposits are characterized by SEM and scanning transmission X-ray microscopy (STXM). STXM allows for the non-destructive quantitative spectromicroscopic characterization of the individual layers with nanoscale resolution and high contrast due to the possibility of resonant imaging [26]. The EBID

Characterization of electroforming-free titanium dioxide memristors

• John Paul Strachan,
• J. Joshua Yang,
• L. A. Montoro,
• C. A. Ospina,
• A. J. Ramirez,
• A. L. D. Kilcoyne,
• Gilberto Medeiros-Ribeiro and
• R. Stanley Williams

Beilstein J. Nanotechnol. 2013, 4, 467–473, doi:10.3762/bjnano.4.55

• performed using scanning transmission X-ray microscopy (STXM) at the Advanced Light Source in the Lawrence Berkeley National Laboratory. STXM allows spatially-resolved X-ray absorption spectroscopy (XAS) to be performed on a sample and is well-suited for chemical and structural characterization of the thin

Tuning the properties of magnetic thin films by interaction with periodic nanostructures

• Ulf Wiedwald,
• Felix Haering,
• Stefan Nau,
• Carsten Schulze,
• Herbert Schletter,
• Denys Makarov,
• Alfred Plettl,
• Karsten Kuepper,
• Manfred Albrecht,
• Johannes Boneberg and
• Paul Ziemann

Beilstein J. Nanotechnol. 2012, 3, 831–842, doi:10.3762/bjnano.3.93

• the highest coercive field for this set of parameters in the interval between 60 and 100 nm. This finding can be compared to the experimentally determined, unperturbed Fe domain wall width as measured by scanning transmission X-ray microscopy (STXM). For a deeper understanding of the micromagnetism

• enhanced coercive field HC up to 280 Oe compared to Fe thin-film reference samples of identical thickness (HC < 10 Oe). Further studies of the domain configuration by scanning transmission X-ray microscopy have provided first evidence that the particles (with magnetic caps) effectively decrease the domain

• transmission X-ray microscopy images of Fe films taken with right circularly polarized light at the Fe-L3 edge show PS particles as well as magnetic contrast in the film after sample demagnetization. Panel (b) presents the XMCD image of the identical sample spot. In (c) an XMCD image at higher resolution is

Towards atomic resolution in sodium titanate nanotubes using near-edge X-ray-absorption fine-structure spectromicroscopy combined with multichannel multiple-scattering calculations

• Carla Bittencourt,
• Peter Krüger,
• Maureen J. Lagos,
• Xiaoxing Ke,
• Gustaaf Van Tendeloo,
• Chris Ewels,
• Polona Umek and
• Peter Guttmann

Beilstein J. Nanotechnol. 2012, 3, 789–797, doi:10.3762/bjnano.3.88

• Functional Materials, Albert-Einstein-Str. 15, 12489 Berlin, Germany 10.3762/bjnano.3.88 Abstract Recent advances in near-edge X-ray-absorption fine-structure spectroscopy coupled with transmission X-ray microscopy (NEXAFS–TXM) allow large-area mapping investigations of individual nano-objects with spectral

• resolution up to E/ΔE = 104 and spatial resolution approaching 10 nm. While the state-of-the-art spatial resolution of X-ray microscopy is limited by nanostructuring process constrains of the objective zone plate, we show here that it is possible to overcome this through close coupling with high-level

• ; sodium titanates; Introduction Transmission X-ray microscopy (TXM) is a popular microscopy technique used in biology [1][2][3]. Recently, we have extended the range of its applications to the spectroscopic characterization of nanoscale materials by combining it with near-edge X-ray-absorption fine

X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge

• Carla Bittencourt,
• Adam P. Hitchock,
• Xiaoxing Ke,
• Gustaaf Van Tendeloo,
• Chris P. Ewels and
• Peter Guttmann

Beilstein J. Nanotechnol. 2012, 3, 345–350, doi:10.3762/bjnano.3.39

• combined with full-field transmission X-ray microscopy can be used to study the electronic structure of graphite flakes consisting of a few graphene layers. The flake was produced by exfoliation using sodium cholate and then isolated by means of density-gradient ultracentrifugation. An image sequence

• presence of topological defects. Doping by metal impurities that were present in the original exfoliated graphite is indicated by the presence of a pre-edge signal at 284.2 eV. Keywords: carbon; graphene; nanostructure; NEXAFS; X-ray microscopy; Introduction The demonstration of the remarkable transport

• combined with X-ray microscopy, NEXAFS can be used to study isolated, free-standing nanostructures [17][18]. Linear dichroism can be used to filter the signal according to selection rules based on the symmetry of the sample electronic states and orientation with respect to the polarisation of the E-vector